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  • Wiki Page: CTK Testing: Freescale i.MX31

    On the Freescale i.MX31 BSP, the following CTK tests are known to fail with the issues described below: Type of Test Description Camera quality verification test In Cameraqualitytests.dll, subtest ID 100 fails because the Sysgen variable SYSGEN_AYGSHELL is set in...
    on22 Sep 2013

  • Wiki Page: Freescale i.MX51

    On the Freescale i.MX51 BSP, the following CTK tests are known to fail with the issues described below: Type of Test Description Camera quality verification test In Cameraqualitytests.dll, subtest ID 100 fails because the Sysgen variable SYSGEN_AYGSHELL is set in the Multimedia_Test...
    on22 Sep 2013

  • Wiki Page: CTK Testing: Microsoft CEPC

    On the CEPC BSP, the following CTK tests are known to fail with the issues described below: Type of Test Description Audio drift tests Audio drift tests are expected to fail if the files are played over a KITL network connection, as KITL is likely responsible...
    on22 Sep 2013

  • Wiki Page: CTK Testing: Freescale i.MX27

    On the Freescale i.MX27 BSP, the following CTK tests are known to fail with the issues described below: Type of Test Description Communication bus tests - regular serial test (pserial.dll) Subtest ID 1001 (Stress Test for 19200 bps) for COM port (UART)...
    on22 Sep 2013

  • Wiki Page: CTK Testing: Microsoft vCEPC

    On the Microsoft vCEPC (virtual CEPC) BSP, the following CTK tests are known to fail with the issues described below: Type of Test Description Display GDI tests (gdit.dll) Subtest 302 (which tests the palette), subtest 806 (which tests device context) and...
    on22 Sep 2013

  • Wiki Page: CTK: Common Test Issues

    On all the BSPs, the following CTK tests are known to fail with the issues described below: Type of Test Description DirectDraw Functional Tests (DDfunc.dll) Subtests 540 and 640 fail on all the platforms DirectDraw Interface Tests (DDInts.dll) ...
    on13 Sep 2013

  • Wiki Page: CTK Testing: ICOP eBox 3300

    On the ICOP 3300 BSP, the following tests are known to fail with the issues described below: Test Type Description DirectDraw tests (DDrawtk.dll) Test IDs 102 (Verify Surface Creation) and 360 (Get Surface Desc) fail on the eBox 3300. DirectDraw...
    on12 Sep 2013

  • Wiki Page: CTK Testing: NEC Electronics NE1TB

    On the NEC Electronics NE1TB Capricorn BSP, the following CTK tests are known to fail with the issues described below: Type of Test Description Audio Waveform Tests (wavetest.dll) Subtest IDs 2001, 2002, 2003, 3001, 3002, 3006 and 3007 fail OAL Timer Tests...
    on12 Sep 2013

  • Wiki Page: CTK Testing: Samsung SMDK6410

    On the Samsung SMDK6410 BSP, the following tests are known to fail with the issues described below: Type of Test Description Audio drift tests Audio drift tests may fail if the files are played over a KITL network connection. To work around this issue,...
    on12 Sep 2013

  • Wiki Page: CTK Testing: Sigma Designs SMP865x

    On the Sigma Designs SMP865x BSP, the following CTK tests are known to fail with the issues described below: Type of Test Description Serial Communication over UART test (pserial.dll) When a Sigma SMP865x device is the master and a CEPC is subordinate,...
    on12 Sep 2013

  • Wiki Page: CTK Testing: TI OMAP3530

    On the TI OMAP3530 BSP, the following tests are known to fail with the issues described below: Type of Test Description Audio Waveform Test (wavetest.dll) Subtest ID 3000 hangs Networking - Ethernet tests (ndt_2c6.dll, perf_ndis6.dll, perf_winsock2...
    on12 Sep 2013

  • Wiki Page: Compact Test Kit (CTK) Portal (Windows Embedded Compact 7)

    Windows Embedded Compact Test Kit The Windows Embedded Compact Test Kit (CTK) is a tool that you can use to test the functionality and performance of device drivers and related hardware for a Windows Embedded Compact device. The test tools in the CTK provide feedback on the functionality of your...
    on29 May 2013
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