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  • Wiki Page: CTK Testing: Freescale i.MX31

    On the Freescale i.MX31 BSP, the following CTK tests are known to fail with the issues described below: Type of Test Description Camera quality verification test In Cameraqualitytests.dll, subtest ID 100 fails because the Sysgen variable SYSGEN_AYGSHELL is set in...
    on22 Sep 2013

  • Wiki Page: Freescale i.MX51

    On the Freescale i.MX51 BSP, the following CTK tests are known to fail with the issues described below: Type of Test Description Camera quality verification test In Cameraqualitytests.dll, subtest ID 100 fails because the Sysgen variable SYSGEN_AYGSHELL is set in the Multimedia_Test...
    on22 Sep 2013

  • Wiki Page: CTK Testing: Microsoft CEPC

    On the CEPC BSP, the following CTK tests are known to fail with the issues described below: Type of Test Description Audio drift tests Audio drift tests are expected to fail if the files are played over a KITL network connection, as KITL is likely responsible...
    on22 Sep 2013

  • Wiki Page: CTK Testing: Freescale i.MX27

    On the Freescale i.MX27 BSP, the following CTK tests are known to fail with the issues described below: Type of Test Description Communication bus tests - regular serial test (pserial.dll) Subtest ID 1001 (Stress Test for 19200 bps) for COM port (UART)...
    on22 Sep 2013

  • Wiki Page: CTK Testing: Microsoft vCEPC

    On the Microsoft vCEPC (virtual CEPC) BSP, the following CTK tests are known to fail with the issues described below: Type of Test Description Display GDI tests (gdit.dll) Subtest 302 (which tests the palette), subtest 806 (which tests device context) and...
    on22 Sep 2013

  • Wiki Page: Introduction to the Windows Embedded Compact Test Kit

    Introduction to the Windows Embedded Compact Test Kit The Windows Embedded Compact Test Kit (CTK) provides significant improvements to the user interface and the overall feature set when compared to the previous release known as Windows Embedded CE Test Kit (CETK). The Windows Embedded...
    on20 Sep 2013

  • Wiki Page: CTK: Common Test Issues

    On all the BSPs, the following CTK tests are known to fail with the issues described below: Type of Test Description DirectDraw Functional Tests (DDfunc.dll) Subtests 540 and 640 fail on all the platforms DirectDraw Interface Tests (DDInts.dll) ...
    on13 Sep 2013

  • Wiki Page: CTK Testing: ICOP eBox 3300

    On the ICOP 3300 BSP, the following tests are known to fail with the issues described below: Test Type Description DirectDraw tests (DDrawtk.dll) Test IDs 102 (Verify Surface Creation) and 360 (Get Surface Desc) fail on the eBox 3300. DirectDraw...
    on12 Sep 2013

  • Wiki Page: CTK Testing: NEC Electronics NE1TB

    On the NEC Electronics NE1TB Capricorn BSP, the following CTK tests are known to fail with the issues described below: Type of Test Description Audio Waveform Tests (wavetest.dll) Subtest IDs 2001, 2002, 2003, 3001, 3002, 3006 and 3007 fail OAL Timer Tests...
    on12 Sep 2013

  • Wiki Page: CTK Testing: Samsung SMDK6410

    On the Samsung SMDK6410 BSP, the following tests are known to fail with the issues described below: Type of Test Description Audio drift tests Audio drift tests may fail if the files are played over a KITL network connection. To work around this issue,...
    on12 Sep 2013

  • Wiki Page: CTK Testing: Sigma Designs SMP865x

    On the Sigma Designs SMP865x BSP, the following CTK tests are known to fail with the issues described below: Type of Test Description Serial Communication over UART test (pserial.dll) When a Sigma SMP865x device is the master and a CEPC is subordinate,...
    on12 Sep 2013

  • Wiki Page: CTK Testing: TI OMAP3530

    On the TI OMAP3530 BSP, the following tests are known to fail with the issues described below: Type of Test Description Audio Waveform Test (wavetest.dll) Subtest ID 3000 hangs Networking - Ethernet tests (ndt_2c6.dll, perf_ndis6.dll, perf_winsock2...
    on12 Sep 2013

  • Wiki Page: CTK Training Videos

    This page contains a number of external training videos that delve into both introductory and advanced concepts relating to the CTK. Introduction to the CTK Introduction to the Graph Tool See Also CTK Portal Wiki: List of Technologies and Related Topics
    on29 May 2013

  • Wiki Page: Compact Test Kit (CTK) Portal (Windows Embedded Compact 7)

    Windows Embedded Compact Test Kit The Windows Embedded Compact Test Kit (CTK) is a tool that you can use to test the functionality and performance of device drivers and related hardware for a Windows Embedded Compact device. The test tools in the CTK provide feedback on the functionality of your...
    on29 May 2013

  • Wiki Page: CTK User Guide

    The following Windows Embedded Compact Test Kit (CTK) sections will guide you through the process of connecting to a device, creating a test pass, running a simple test, and viewing the results of the test pass. Connecting to a Device Creating a Test Pass Running a Test Pass Viewing Test...
    on24 Feb 2013

  • Wiki Page: CTK: Use the Graph Tool

    You can use the Graph Tool to graphically display the results of key performance tests such as the Winsock, USB, and Bluetooth performance tests. The Graph Tool can be run from within the Windows Embedded Compact Test Kit (CTK) or from the console command line. You can use the console version of the...
    on21 Feb 2013

  • Wiki Page: Additional Microsoft CEPC Specific Information

    Recommended Microsoft CEPC Hardware Specification Specification Version 1 Chassis CEPC Dual Core 6 Slot MotherBoard ITOX LT600-D PCI Based Serial Port XPERT 98 8MB PCI Processor E1200 Dual Core...
    on21 Feb 2013

  • Wiki Page: CTK: Connecting to a Device

    Before trying to connect to a device from the Windows Embedded Compact Test Kit (CTK), your device must be running and attached to Platform Builder. To connect to a device In Windows Embedded Compact Test Kit, on the Connection menu, click Connect to Device . In the Select a Device dialog...
    on7 Feb 2013

  • Wiki Page: CTK: Detecting Peripherals

    In the Windows Embedded Compact Test Kit ( CTK) you can enable or disable peripheral detection. If peripheral detection is enabled, when connecting to a device the CTK checks the device for peripherals that each test case requires . In the Test pass display window a “not detected” icon...
    on9 Jul 2012

  • Wiki Page: CTK: Manage Tests

    You can add your own test cases (with Windows Embedded Compact Test Kit--CTK) to a test case catalog and create test pass templates using the Test Manager. Table of Contents Adding a Test Case to a Test Catalog Windows Embedded Test Catalog See Also To open the Test Manager: In Windows...
    on10 Jun 2011

  • Wiki Page: CTK: View Test Results

    After all of the tests have completed running (with Windows Embedded Compact Test Kit--CTK), the Test pass display window shows whether each test passed or failed. Test logs and results are saved for each test. To view the overall results for a test pass In the Windows Embedded Compact Test...
    on10 Jun 2011

  • Wiki Page: CTK: Create a Test Pass

    Before you create a test pass (with Windows Embedded Compact Test Kit--CTK), you must create a template to base your test pass on. This section describes what a test pass is, how to create a test pass template, and how to create a test pass from a template. Table of Contents What is a Test Pass...
    on10 Jun 2011

  • Wiki Page: CTK: Run a Test Pass

    There are several options for running a test (with Windows Embedded Compact Test Kit--CTK) from the currently active test pass in the Test pass display window. You can run all of the tests in the test pass, which are run sequentially. This is the default option unless you deselect specific tests...
    on10 Jun 2011
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